Advanced Electron Microscopy Reveals Short Range Ordering Motifs in Semiconductors

Andrew Minor, Faculty Scientist, Division Director, National Center for Electron Microscopy (NCEM), photographed outside the NCEM facility at Lawrence Berkeley National Laboratory (Berkeley Lab), 09/09/2025.

In a recent paper published in Science, Prof. Minor’s group used energy-filtered scanning nano electron diffraction (4D-STEM) to uniquely identify short range ordering motifs in GeSiSn. This publication represents the first direct evidence of SRO in a semiconductor material, an exciting new area for exploration in the field of microelectronics.

Read the full article here.